News
- 13.05.2019 ISO/TS 19807-2 "Nanotechnologies -- Magnetic nanomaterials -- Part 2: Specification of characteristics and measurements for nanostructured superparamagnetic beads for nucleic acid extraction
- 01.12.2016 Industrie 4.0: Deutsch-Chinesische Zusammenarbeit nimmt Fahrt auf
- 15.11.2016 Deutsch-chinesisches Seminar in Chengdu
Links
- BAM - Bundesanstalt für Materialforschung und -prüfung
- DIN Media - DIN Media GmbH
- BMWK - Bundesministerium für Wirtschaft und Klimschutz
- DIN - Deutsches Institut für Normung
- PTB - Physikalisch-Technische Bundesanstalt
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GB/T 43917.2-2024
Equipment for capture and separation of welding fume—Part 2: Requirements for testing and marking of separation efficiency
GB/T 43905.5-2024
焊接及相关工艺中烟尘和气体取样的实验室方法 第5部分:基于热解-气相色谱-质谱法的焊接或切割中有机材料热降解物的识别
Laboratory method for sampling fume and gases in welding and allied processes—Part 5: Identification of thermal-degradation products generated when welding or cutting through products composed wholly or partly of organic materials using pyrolysis-gas chro
GB/T 42513.4-2023
镍合金化学分析方法 第4部分:硅含量的测定 一氧化二氮-火焰原子吸收光谱法和钼蓝分光光度法
Methods for chemical analysis of nickel alloys—Part 4:Determination of silicon content—Nitrous oxide-flame atomic absorption spectrometry and molybdenum blue spectrophotometry
GB/Z 44005.1-2024
Nanotechnologies—Clay nanomaterials—Part 1: Specification of characteristics and measurement methods for layered clay nanomaterials
GB/T 44006-2024
Rules for the representation of infrared image temperature—Method by RGB
GB/T 44004-2024
Nanotechnologies—Test methods for the characterization of organic transistors and materials
GB/T 44003-2024
Mechanical property measurement—Delamination strength test for REBCO coated conductors (copper-plated)
GB/T 43493.2-2023
半导体器件 功率器件用碳化硅同质外延片缺陷的无损检测识别判据 第2部分:缺陷的光学检测方法
Semiconductor device—Non-destructive recognition criteria of defects in silicon carbide homoepitaxial wafer for power devices—Part 2: Test method for defects using optical inspection